SFB 1176 • Molekulare Strukturierung weicher Materie

Project Z1 • Surface Analysis Platform: X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

The Surface Analysis Platform combines complementary XPS and ToF-SIMS with Ar cluster ion sputter depth profiling to quantitatively prove every single reaction step of organic synthesis routes on various substrates and to evidence 3D structures at high spatial resolution. For all subprojects of section B and C individual approaches will be adapted to prevent from method induced damage. If necessary, NEXAFS and FE-SEM are available to corroborate the results. Thus, the platform will provide quantitative chemical and molecular information on the chemical and geometrical integrity of the desired structures/modifications.

Publications 2018
Title Author Source

Müller, R.; Feuerstein, T. J.; Trouillet, V.; Bestgen, S.; Roesky, P. W.; Barner-Kowollik, C. 

Chem. Eur. J. 2018, 24, 18933-18943. (see Cover Feature)

Moock, D. S.; Steinmüller, S. O.; Wessely, I. D.; Llevot, A.; Bitterer, B.; Meier, M. A. R.; Bräse, S.; Ehrenberg, H.; Scheiba, F.

ACS Appl. Mater. Interfaces, 2018, 10, 24172-24180.

Publications 2017
Title Author Source

Wuest, K. N. R.; Trouillet, V.; Köppe, R.; Roesky, P. W.; Goldmann, A. S.; Stenzel, M. H.; Barner-Kowollik, C.

Polym. Chem. 2017, 8, 838-842.

Bally-Le Gall, F.; Hussal, C.; Kramer, J.; Cheng, K.; Kumar, R.; Eyster, T.; Baek, A.; Trouillet, V.; Nieger, M.; Bräse, S.; Lahann, J.

Chem. Eur. J. 2017, 23, 13342–13350. 

Llevot, A.; Steinmüller, S. O.; Bitterer, B.; Berson, J.; Wahlheim, S.; Schimmel, T.; Bräse, S.; Scheiba, F.; Meier, M. A. R.:

Polym. Chem., 2017, 8, 5824-5828.

Cavalli, F.; Mutlu, H.; Steinmueller, S. O.; Barner, L.

Polym. Chem., 2017, 8, 3778-3782.

Koenig, M.; Kumar, R.; Hussal, C.; Trouillet, V.; Barner, L.; Lahann, J.

Macromol. Chem. Phys. 2017, 218, 1600521.

Publications 2016
Title Author Source

Schneider, T.; Czolk, J.; Landerer, D.; Gärtner, S.; Puetz, A.; Bruns, M.; Behrends, J.; Colsmann, A.

J. Mater. Chem. A 2016, 4, 14703-14708.