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Michael Bruns
Principal Investigator
Dr. Michael Bruns
Institut für Angewandte Materialien

+49 721 608-22641

E-Mail: michael brunsCrn4∂kit edu

Helmut Ehrenberg
Principal Investigator
Prof. Dr. Helmut Ehrenberg
Institut für Angewandte Materialien

+49 721 608-26363

E-Mail: helmut ehrenbergNxh1∂kit edu

Christof Wöll
Principal Investigator
Prof. Dr. Christof Wöll
Institut für Funktionelle Grenzflächen

+49 721 608-23934

E-Mail: christof woellDsb4∂kit edu

SFB 1176
SFB 1176 Logo

Molekulare Strukturierung weicher Materie

Name Phone E-Mail
+49 721 608-22641 michael brunsFae6∂kit edu
+49 721 608-26363 helmut ehrenbergXok7∂kit edu
+49 721 608-23221 sven steinmuellerWyh7∂kit edu
+49 721 608-23934 christof woellBbs1∂kit edu

Project Z1 • Surface Analysis Platform: X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

The Surface Analysis Platform combines complementary XPS and ToF-SIMS with Ar cluster ion sputter depth profiling to quantitatively prove every single reaction step of organic synthesis routes on various substrates and to evidence 3D structures at high spatial resolution. For all subprojects of section B and C individual approaches will be adapted to prevent from method induced damage. If necessary, NEXAFS and FE-SEM are available to corroborate the results. Thus, the platform will provide quantitative chemical and molecular information on the chemical and geometrical integrity of the desired structures/modifications.

Publications 2017
Title Author Source

Koenig, M.; Kumar, R.; Hussal, C.; Trouillet, V.; Barner, L.; Lahann, J.

Macromol. Chem. Phys. 2017, DOI: 10.1002/macp.201600521.

Publications 2016
Title Author Source

Schneider, T.; Czolk, J.; Landerer, D.; Gärtner, S.; Puetz, A.; Bruns, M.; Behrends, J.; Colsmann, A.

J. Mater. Chem. A 2016, 4, 14703-14708.